IST 8920 DISCRETE SEMICONDUCTOR TEST SYSTEM WITH CURVE TRACER
A Complete and Cost Effective Automated Test Equipment (ATE) System
for Testing of Discrete Semiconductor Components from mW to kW
HIGH POWER SEMICONDUCTOR TESTING
Semiconductors should be tested at its actual operating temperature to uncover problems that only appear when a device is under thermal stress. The IST 8920 features a Constant Temperature source to make it easy to test high power devices at their operating temperatures so that failing devices can be detected early before they become a serious problem.
The 8920 supports high power ON-state parameter testing for Vce(sat), Vds(on), Rds(on), Vsd, Vf, and Vtm at force currents of 400 A, 800 A, 1,600 A, 2,400 A, 3,200 A and 4,800 A.
Force voltages for Off-state parameter testing of Breakdown Voltage and Leakage Current measurements can be set to 2.5 KV, 5 KV, 7.5 KV or 10 KV.
BREAKDOWN KNEE DETECTION
KELVIN TEST SOCKET FOR HIGH POWER TESTING
When testing with a Kelvin test socket mounted directly onto the 8920’s high power test head, testing can be performed with currents up to 350 A or voltages up to 5 KV.
Device Packages: TO-220, TO-264, TO-247, 247PLUS, TO-247HV, & ISOPLUSi5-Pak
KELVIN TEST FIXTURES FOR HIGH POWER TESTING
The IST 8920 includes specialized test fixtures that make it easy to setup and measure high power devices such as IGBTs, MOSFETs, Transistors, GTOs, SCRs, and Diodes. The test fixtures provide error-free testing while eliminating tedious and time consuming setups needed to secure test leads and sources to a DUT. Using the test fixtures, testing can be performed at currents up to 4800 A and at voltages up to 10 KV.
SAFETY FEATURES FOR HIGH POWER TESTING
Numerous safety features were designed into the IST 8920 to prevent harm to the DUT, the tester, and the user operating it. Before each test, a safety check is performed to prevent testing on defective, incorrect device types, or pin-outs before power is applied.
During high power testing, a beeper alarm and a high voltage warning light will turn on to warn the user that high voltage is being applied. If an over-current or short circuit condition is sensed or if the DUT’s self break-over or second breakdown condition is reached the tester will shut down as a safety precaution.
The 8920 includes a “Safety Start” feature that protects the user from accidentally starting a test while still handling the device to be tested. When the Safety Start mode is enabled, the user must press a safety button and the Start Test button at the same time in order to run a test.
POWER MODULE TEST FIXTURE WITH CONSTANT TEMPERATURE CONTROL (Patent Pending)
VICE CLAMPING TEST FIXTURE (Patent Pending)
HOT PLATE STAND w/TEMPERATURE CONTROL
IGBT 6-1 Decoder
- Test 12 different semiconductor devices with 135 parameters
- User friendly interface powered by a Windows 7 touch screen PC
- Auto-calibration and self-test diagnostics
- Maximum current and voltage can be individually selected up to 4,800 A / 10 KV
- Curve tracer program built-in
USB Printer interface for printing test reports
- Provides accurate Kelvin or Non-Kelvin testing options
- Constant temperature controller heats DUTs up to 200 oC
- Stores and recalls previous test programs
- Provides automatic Go/No Go tests or parametric measurements
- Handler interface for wafer or package level production testing
- Start-up safety check prevents testing on defective, incorrect DUTs, or pin-outs
- Adjustable pulsing test from 80 uS to 300 uS
- Detects soft or sharp breakdown knee in breakdown voltage test
- Optional 6-1 IGBT module testing
- Safety Start test mode to protect user from accidental test starts
- Fixtures available for easier testing of module packages
Previous generation stand alone tester with add-on modules